Daewon Kwon
7Patents
3h-index
5Co-inventors
46Inventor score
Filing activity: Jan 31, 2001 → Jul 30, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6519045B2 | Method and apparatus for measuring very thin dielectric film thickness and creating a stable measurement environment | Electricity | 18 | Expired |
| US6934031B2 | Methods and apparatus for determining optical constants of semiconductors and dielectrics with interband states | Physics | 3 | Expired |
| US9627239B2 | Wafer surface 3-D topography mapping based on in-situ tilt measurements in chemical vapor deposition systems | Electricity | 3 | Active |
| US9448119B2 | Radiation thermometer using off-focus telecentric optics | Physics | 1 | Active |
| US9085824B2 | Control of stray radiation in a CVD chamber | Emerging Cross-Sectional Technologies | 1 | Active |
| US9748113B2 | Method and apparatus for controlled dopant incorporation and activation in a chemical vapor deposition system | Electricity | 0 | Active |
| US9976909B2 | Control of stray radiation in a CVD chamber | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.