Inventor · Tokyo, JP

Daisuke Bizen

19Patents
2h-index
38Co-inventors
46Inventor score

Filing activity: Apr 3, 2014 → Oct 8, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US11011348B2 Scanning electron microscope and sample observation method using scanning electron microscope Electricity 4 Active
US9336984B2 Charged particle beam device and measuring method using the same Electricity 4 Active
US9966225B2 Charged particle beam device, simulation method, and simulation device Electricity 2 Active
US9520266B2 Pattern critical dimension measurement equipment and method for measuring pattern critical dimension Electricity 2 Active
US10217604B2 Charged particle beam apparatus Electricity 0 Active
US10014160B2 Scanning electron microscope and method for controlling same Electricity 0 Active
US12191111B2 Charged particle beam system and method for determining observation conditions in charged particle beam device Electricity 0 Active
US10825649B2 Electron beam device Electricity 0 Active
US11610756B2 Charged particle beam apparatus and control method Electricity 0 Active
US11211224B2 Charged particle beam apparatus Electricity 0 Active
US10338367B2 Scanning microscope with controlled variable measurement parameters Electricity 0 Active
US11211226B2 Pattern cross-sectional shape estimation system and program Electricity 0 Active
US11164720B2 Scanning electron microscope and calculation method for three-dimensional structure depth Electricity 0 Active
US10262830B2 Scanning electron microscope and electron trajectory adjustment method therefor Electricity 0 Active
US11869745B2 Charged particle beam device Electricity 0 Active
US12406826B2 Charged particle beam device and sample observation method Electricity 0 Active
US12181513B2 Inspection method Physics 0 Active
US11282671B2 Charged-particle beam apparatus Electricity 0 Active
US11456150B2 Charged particle beam device Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.