David Mordo
15Patents
8h-index
25Co-inventors
72Inventor score
Filing activity: Dec 7, 1990 → Feb 19, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7265061B1 | Method and apparatus for UV exposure of low dielectric constant materials for porogen removal and improved mechanical properties | Electricity | 573 | Expired |
| US7253125B1 | Method to improve mechanical strength of low-k dielectric film using modulated UV exposure | Electricity | 68 | Expired |
| US5114242A | Bichannel radiation detection method | Physics | 47 | Expired |
| US7241704B1 | Methods for producing low stress porous low-k dielectric materials using precursors with organic functional groups | Electricity | 43 | Expired |
| US7622400B1 | Method for improving mechanical properties of low dielectric constant materials | Electricity | 32 | Expired |
| US7611757B1 | Method to improve mechanical strength of low-K dielectric film using modulated UV exposure | Electricity | 32 | Active |
| US8043667B1 | Method to improve mechanical strength of low-K dielectric film using modulated UV exposure | Electricity | 16 | Active |
| US7473653B1 | Methods for producing low stress porous low-k dielectric materials using precursors with organic functional groups | Electricity | 9 | Active |
| US8715788B1 | Method to improve mechanical strength of low-K dielectric film using modulated UV exposure | Electricity | 8 | Active |
| US6214526A | Semiconductor processing using antireflective layer having high wet etch rate | Electricity | 7 | Expired |
| US9659769B1 | Tensile dielectric films using UV curing | Electricity | 6 | Active |
| US7799705B1 | Methods for producing low stress porous low-k dielectric materials using precursors with organic functional groups | Electricity | 4 | Active |
| US7781351B1 | Methods for producing low-k carbon doped oxide films with low residual stress | Electricity | 2 | Expired |
| US9870937B2 | High productivity deposition reactor comprising a gas flow chamber having a tapered gas flow space | Electricity | 1 | Active |
| US10192762B2 | Systems and methods for detecting the existence of one or more environmental conditions within a substrate processing system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.