David Sun
23Patents
11h-index
9Co-inventors
60Inventor score
Filing activity: Apr 28, 2003 → Nov 12, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7474576B2 | Repairing Advanced-Memory Buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module | Physics | 70 | Active |
| US7379361B2 | Fully-buffered memory-module with redundant memory buffer in serializing advanced-memory buffer (AMB) for repairing DRAM | Physics | 45 | Active |
| US7487428B2 | Fully-buffered memory-module with error-correction code (ECC) controller in serializing advanced-memory buffer (AMB) that is transparent to motherboard memory controller | Physics | 38 | Active |
| US7832645B2 | Flash memory card expander | Electricity | 29 | Active |
| US6910162B2 | Memory-module burn-in system with removable pattern-generator boards separated from heat chamber by backplane | Physics | 17 | Expired |
| US6824410B1 | Zero-insertion-force hinged clam-shell socket for testing memory modules | Electricity | 17 | Expired |
| US7111211B1 | Efficient air-flow loop through dual burn-in chambers with removable pattern-generator boards for memory-module environmental testing | Physics | 15 | Expired |
| US7272774B2 | Extender card for testing error-correction-code (ECC) storage area on memory modules | Physics | 15 | Expired |
| US6981886B1 | Sliding levered handles engaging and pushing memory modules into extender-card socket | Electricity | 14 | Expired |
| US7473568B2 | Memory-module manufacturing method with memory-chip burn-in and full functional testing delayed until module burn-in | Physics | 12 | Active |
| US7277337B1 | Memory module with a defective memory chip having defective blocks disabled by non-multiplexed address lines to the defective chip | Physics | 11 | Active |
| US8176230B2 | Wireless flash memory card expansion system | Physics | 10 | Active |
| US7619938B2 | Repairing advanced-memory buffer (AMB) with redundant memory buffer for repairing DRAM on a fully-buffered memory-module | Physics | 8 | Active |
| US7642105B2 | Manufacturing method for partially-good memory modules with defect table in EEPROM | Electricity | 8 | Active |
| US7478290B2 | Testing DRAM chips with a PC motherboard attached to a chip handler by a solder-side adaptor board with an advanced-memory buffer (AMB) | Physics | 6 | Active |
| US7509532B2 | Robotic memory-module tester using adapter cards for vertically mounting PC motherboards | Electricity | 6 | Expired |
| US8282012B2 | Flash memory card expander | Electricity | 5 | Active |
| US7117405B2 | Extender card with intercepting EEPROM for testing and programming un-programmed memory modules on a PC motherboard | Physics | 5 | Expired |
| US7131040B2 | Manifold-Distributed Air Flow Over Removable Test Boards in a Memory-Module Burn-In System With Heat Chamber Isolated by Backplane | Physics | 3 | Expired |
| US7760574B2 | Flash memory controller utilizing multiple voltages and a method of use | Physics | 3 | Active |
| US7864615B2 | Flash memory controller utilizing multiple voltages and a method of use | Physics | 2 | Expired |
| US8667191B2 | Managing and indentifying multiple memory storage devices | Physics | 0 | Active |
| US8040749B2 | Flash memory controller utilizing multiple voltages and a method of use | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.