Douglas E. Paradis
12Patents
7h-index
17Co-inventors
59Inventor score
Filing activity: Jun 18, 1991 → Feb 4, 2009
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5841543A | Method and apparatus for verifying the presence of a material applied to a substrate | Physics | 82 | Expired |
| US5551165A | Enhanced cleansing process for wafer handling implements | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5978078A | System and method for detecting particles on substrate-supporting chucks of photolithography equipment | Physics | 13 | Expired |
| US5244839A | Semiconductor hybrids and method of making same | Electricity | 13 | Expired |
| US5473187A | Hybrids semiconductor circuit | Electricity | 11 | Expired |
| US5839455A | Enhanced high pressure cleansing system for wafer handling implements | Emerging Cross-Sectional Technologies | 9 | Expired |
| US5958517A | System and method for cleaning nozzle delivering spin-on-glass to substrate | Performing Operations; Transporting | 8 | Expired |
| US6054367A | Ion implant of the moat encroachment region of a LOCOS field isolation to increase the radiation hardness | Electricity | 7 | Expired |
| US6067163A | Automated substrate pattern recognition system | Electricity | 6 | Expired |
| US5405807A | Semiconductor hybrids and method of making same | Electricity | 5 | Expired |
| US8219351B2 | Methods and systems to align wafer signatures | Emerging Cross-Sectional Technologies | 0 | Active |
| US7987014B2 | Systems and methods for selecting wafer processing order for cyclical two pattern defect detection | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.