Ernst Demm
6Patents
2h-index
7Co-inventors
36Inventor score
Filing activity: Nov 6, 2003 → Dec 13, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7235454B2 | MIM capacitor structure and method of fabrication | Electricity | 8 | Active |
| US7188321B2 | Generation of metal holes by via mutation | Electricity | 2 | Expired |
| US7112507B2 | MIM capacitor structure and method of fabrication | Electricity | 2 | Expired |
| US7842592B2 | Channel strain engineering in field-effect-transistor | Electricity | 1 | Active |
| US7875544B2 | Method of producing a semiconductor interconnect architecture including generation of metal holes by via mutation | Electricity | 1 | Active |
| US8378493B2 | Generation of metal holes by via mutation | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.