Eugene Wang
23Patents
6h-index
17Co-inventors
66Inventor score
Filing activity: Jul 30, 1992 → Mar 28, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6167469A | Digital camera having display device for displaying graphical representation of user input and method for transporting the selected digital images thereof | Electricity | 333 | Expired |
| US5289138A | Apparatus for synchronously selecting different oscillators as system clock source | Physics | 35 | Expired |
| US7669197B1 | Embedded system employing component architecture platform | Physics | 18 | Active |
| US7840383B2 | Operationalizing a power usage monitoring system | Emerging Cross-Sectional Technologies | 11 | Active |
| US6850846B2 | Computer software for genotyping analysis using pattern recognition | Physics | 7 | Expired |
| US6789031B2 | Method for determining the equivalency index of products, processes, and services | Physics | 7 | Expired |
| US7003430B2 | Method and system for processing commonality of semiconductor devices | Physics | 4 | Expired |
| US11636327B2 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Physics | 4 | Active |
| US7024334B2 | Method and system for yield similarity of semiconductor devices | Physics | 2 | Expired |
| US7447610B2 | Method and system for reliability similarity of semiconductor devices | Physics | 1 | Active |
| US6965844B1 | Method and system for processing stability of semiconductor devices | Electricity | 1 | Expired |
| US7286958B2 | Method and system for yield similarity of semiconductor devices | Physics | 1 | Expired |
| US7319938B2 | Method and system for processing commonality of semiconductor devices | Physics | 0 | Expired |
| US12380326B2 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Physics | 0 | Active |
| US7076387B2 | Method for determining the equivalency index of products and processes | Physics | 0 | Expired |
| US7831409B2 | Method and system for yield similarity of semiconductor devices | Physics | 0 | Active |
| US12090350B2 | Fall protection locking assembly, fall protection device and fall protection system | Human Necessities | 0 | Active |
| US8044668B2 | Method and system for calibrating measurement tools for semiconductor device manufacturing | Physics | 0 | Expired |
| US12014265B2 | Machine learning sparse computation mechanism for arbitrary neural networks, arithmetic compute microarchitecture, and sparsity for training mechanism | Physics | 0 | Active |
| US7321836B2 | Method for determining the equivalency index of goods, processes, and services | Physics | 0 | Expired |
| US7989228B2 | Method and structure for sample preparation for scanning electron microscopes in integrated circuit manufacturing | Electricity | 0 | Active |
| US8942955B2 | Operationalizing a power usage monitoring system | Emerging Cross-Sectional Technologies | 0 | Active |
| US11865379B2 | Linkage operation assembly, fall protection device and fall protection system | Human Necessities | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.