Frank Fehrmann
8Patents
2h-index
15Co-inventors
44Inventor score
Filing activity: Jun 29, 2004 → Nov 12, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7057408B2 | Method and prober for contacting a contact area with a contact tip | Physics | 7 | Expired |
| US9110131B2 | Method and device for contacting a row of contact areas with probe tips | Physics | 3 | Active |
| US7573283B2 | Method for measurement of a device under test | Physics | 1 | Active |
| US8368413B2 | Method for testing electronic components of a repetitive pattern under defined thermal conditions | Physics | 1 | Active |
| US9373533B2 | Systems and methods for providing wafer access in a wafer processing system | Electricity | 0 | Active |
| US11693050B2 | Semiconductor inspecting method | Electricity | 0 | Active |
| US10996239B1 | Method of positioning probe tips relative to pads | Electricity | 0 | Active |
| US11703541B2 | Semiconductor inspecting method for ensuring scrubbing length on pad | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.