Inventor · Milpitas, CA, US

Gerard Moloney

14Patents
9h-index
15Co-inventors
61Inventor score

Filing activity: Apr 19, 1999 → Jun 13, 2005

Most-cited inventions

PatentTitleAreaCited byStatus
US6506105B1 System and method for pneumatic diaphragm CMP head having separate retaining ring and multi-region wafer pressure control Performing Operations; Transporting 61 Expired
US6558232B1 System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control Performing Operations; Transporting 51 Expired
US6623343B2 System and method for CMP head having multi-pressure annular zone subcarrier material removal control Performing Operations; Transporting 28 Expired
US6309290A Chemical mechanical polishing head having floating wafer retaining ring and wafer carrier with multi-zone polishing pressure control Performing Operations; Transporting 25 Expired
US6893327B2 Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface Performing Operations; Transporting 19 Expired
US6887132B2 Slurry distributor for chemical mechanical polishing apparatus and method of using the same Performing Operations; Transporting 17 Expired
US6527625B1 Chemical mechanical polishing apparatus and method having a soft backed polishing head Performing Operations; Transporting 10 Expired
US7326103B2 Vertically adjustable chemical mechanical polishing head and method for use thereof Performing Operations; Transporting 10 Expired
US6916226B2 Chemical mechanical polishing apparatus having a stepped retaining ring and method for use thereof Performing Operations; Transporting 9 Expired
US7004822B2 Chemical mechanical polishing and pad dressing method Performing Operations; Transporting 7 Expired
US7125326B2 Apparatus and method for removing a CMP polishing pad from a platen Performing Operations; Transporting 6 Expired
US7118456B2 Polishing head, retaining ring for use therewith and method fo polishing a substrate Performing Operations; Transporting 6 Expired
US6966822B2 System and method for CMP having multi-pressure zone loading for improved edge and annular zone material removal control Performing Operations; Transporting 6 Expired
US6641461B2 Chemical mechanical polishing apparatus having edge, center and annular zone control of material removal Performing Operations; Transporting 2 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.