H. Daniel Dulman
14Patents
4h-index
2Co-inventors
39Inventor score
Filing activity: Jan 29, 2001 → Sep 1, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6803155B2 | Microlithographic device, microlithographic assist features, system for forming contacts and other structures, and method of determining mask patterns | Physics | 12 | Expired |
| US6841310B2 | Radiation patterning tools, and methods of forming radiation patterning tools | Physics | 8 | Expired |
| US7008738B2 | Microlithographic structures and method of fabrication | Physics | 5 | Expired |
| US7291425B2 | Radiation patterning tools, and methods of forming radiation patterning tools | Physics | 4 | Expired |
| US7086031B2 | Methods of forming patterned reticles | Physics | 3 | Expired |
| US7093227B2 | Methods of forming patterned reticles | Physics | 3 | Expired |
| US6842889B2 | Methods of forming patterned reticles | Physics | 2 | Expired |
| US7073161B2 | Methods of forming patterned reticles | Physics | 2 | Expired |
| US7107572B2 | Methods of forming patterned reticles | Physics | 1 | Expired |
| US7350182B2 | Methods of forming patterned reticles | Physics | 1 | Active |
| US6737200B2 | Method for aligning a contact or a line to adjacent phase-shifter on a mask | Physics | 0 | Expired |
| US7226707B2 | Methods of printing structures | Physics | 0 | Expired |
| US6911301B2 | Methods of forming aligned structures with radiation-sensitive material | Physics | 0 | Expired |
| US6887629B2 | Radiation-patterning tool | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.