Han-Wei Yang
17Patents
3h-index
11Co-inventors
49Inventor score
Filing activity: Jun 28, 2013 → Dec 6, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9076804B2 | Systems and methods to enhance passivation integrity | Electricity | 6 | Active |
| US9349688B2 | Systems and methods to enhance passivation integrity | Electricity | 4 | Active |
| US9070687B2 | Semiconductor device with self-protecting fuse | Electricity | 3 | Active |
| US9761486B2 | Method of chip packaging | Electricity | 2 | Active |
| US10014251B2 | Semiconductor device with self-protecting fuse and method of fabricating the same | Electricity | 0 | Active |
| US10157810B2 | Systems and methods to enhance passivation integrity | Electricity | 0 | Active |
| US10204843B2 | Interconnect arrangement with stress-reducing structure and method of fabricating the same | Electricity | 0 | Active |
| US9406559B2 | Semiconductor structure and method for forming the same | Electricity | 0 | Active |
| US9472508B2 | Interconnect arrangement with stress-reducing structure and method of fabricating the same | Electricity | 0 | Active |
| US10777480B2 | Systems and methods to enhance passivation integrity | Electricity | 0 | Active |
| US9299621B2 | Smart measurement techniques to enhance inline process control stability | Electricity | 0 | Active |
| US9818666B2 | Interconnect arrangement with stress-reducing structure and method of fabricating the same | Electricity | 0 | Active |
| US10515866B2 | Systems and methods to enhance passivation integrity | Electricity | 0 | Active |
| US9773716B2 | Systems and methods to enhance passivation integrity | Electricity | 0 | Active |
| US9252047B2 | Interconnect arrangement with stress-reducing structure and method of fabricating the same | Electricity | 0 | Active |
| US9093373B2 | Conductive diffusion barrier structure for ohmic contacts | Electricity | 0 | Active |
| US9299658B2 | Semiconductor device with self-protecting fuse and method of fabricating the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.