Inventor · Kuroishi, JP

Hideko Oodaira

26Patents
7h-index
18Co-inventors
62Inventor score

Filing activity: Apr 11, 1994 → Aug 20, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US6353242B1 Nonvolatile semiconductor memory Electricity 79 Expired
US5734286A Driving device of charge pump circuit and driving pulse generation method thereof Electricity 39 Expired
US6512253B2 Nonvolatile semiconductor memory Electricity 25 Expired
US5477495A Nonvolatile semiconductor memory apparatus Physics 14 Expired
US6240012A Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 13 Expired
US6974979B2 Nonvolatile semiconductor memory Electricity 9 Expired
US5943282A Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Physics 7 Expired
US5812455A Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Physics 6 Expired
US7425739B2 Nonvolatile semiconductor memory Electricity 4 Expired
US7359228B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 3 Active
US6424588B1 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 3 Expired
US6611447B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 3 Expired
US7893477B2 Nonvolatile semiconductor memory Electricity 3 Active
US7002845B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 3 Expired
US6836444B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 2 Expired
US7332762B2 Nonvolatile semiconductor memory Electricity 2 Active
US6172930A Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Physics 2 Expired
US6335894B1 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Physics 2 Expired
US7787277B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 2 Active
US8084802B2 Nonvolatile semiconductor memory Electricity 2 Active
US8350309B2 Nonvolatile semiconductor memory Physics 1 Active
US6487118B2 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, METHOD OF INVESTIGATING CAUSE OF FAILURE OCCURRING IN SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF VERIFYING OPERATION OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE Physics 1 Expired
US8248849B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 0 Active
US8259494B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 0 Active
US7151685B2 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.