Hisao Asakura
14Patents
6h-index
27Co-inventors
62Inventor score
Filing activity: Apr 26, 1985 → Nov 19, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6771077B2 | Method of testing electronic devices indicating short-circuit | Physics | 77 | Expired |
| US6287912A | Method of fabricating semiconductor device | Emerging Cross-Sectional Technologies | 10 | Expired |
| US6198128A | Method of manufacturing a semiconductor device, and semiconductor device | Electricity | 7 | Expired |
| US6566719B1 | Semiconductor integrated circuit | Electricity | 6 | Expired |
| US6895346B2 | Method for test conditions | Physics | 6 | Expired |
| US6399453B2 | Process of manufacturing semiconductor integrated circuit device having an amorphous silicon gate | Electricity | 6 | Expired |
| US6020228A | CMOS device structure with reduced short channel effect and memory capacitor | Electricity | 5 | Expired |
| US4633187A | AM synchronous detecting circuit | Electricity | 5 | Expired |
| US6780660B2 | System for testing electronic devices | Physics | 4 | Expired |
| US6265254A | Semiconductor integrated circuit devices and a method of manufacturing the same | Electricity | 4 | Expired |
| US6812540B2 | Semiconductor integrated circuit device | Electricity | 3 | Expired |
| US6770496B2 | Method of testing electronic devices | Physics | 3 | Expired |
| US6077735A | Method of manufacturing semiconductor device | Electricity | 2 | Expired |
| US6841405B2 | Photomask for test wafers | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.