Hock Ng
17Patents
6h-index
12Co-inventors
59Inventor score
Filing activity: Jun 18, 2001 → Dec 23, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7099073B2 | Optical frequency-converters based on group III-nitrides | Physics | 15 | Expired |
| US8754925B2 | Audio source locator and tracker, a method of directing a camera to view an audio source and a video conferencing terminal | Electricity | 13 | Active |
| US7952109B2 | Light-emitting crystal structures | Electricity | 11 | Active |
| US9955209B2 | Immersive viewer, a method of providing scenes on a display and an immersive viewing system | Electricity | 8 | Active |
| US6986693B2 | Group III-nitride layers with patterned surfaces | Electricity | 7 | Expired |
| US6891187B2 | Optical devices with heavily doped multiple quantum wells | Electricity | 6 | Expired |
| US7468578B2 | Group III-nitride layers with patterned surfaces | Electricity | 5 | Expired |
| US7084563B2 | Group III-nitride layers with patterned surfaces | Electricity | 5 | Expired |
| US8070966B2 | Group III-nitride layers with patterned surfaces | Electricity | 2 | Active |
| US8569042B2 | DNA structures on ferroelectrics and semiconductors | Physics | 1 | Expired |
| US6728282B2 | Engineering the gain/loss profile of intersubband optical devices having heterogeneous cascades | Electricity | 1 | Expired |
| US9062889B2 | Temperature based location determination system and method | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US7692198B2 | Wide-bandgap semiconductor devices | Electricity | 0 | Active |
| USRE47767E1 | Group III-nitride layers with patterned surfaces | General | 0 | Active |
| US9294716B2 | Method and system for controlling an imaging system | Physics | 0 | Active |
| US9008487B2 | Spatial bookmarking | Electricity | 0 | Active |
| US8613860B2 | Group III-nitride layers with patterned surfaces | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.