Hojun Yoon
13Patents
2h-index
20Co-inventors
54Inventor score
Filing activity: Dec 17, 2003 → Jul 5, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11699472B2 | Semiconductor memory device and memory system including the same | Physics | 2 | Active |
| US11742016B2 | Quadrature error correction circuit and semiconductor memory device including the same | Electricity | 2 | Active |
| US12057156B2 | Quadrature error correction circuit and semiconductor memory device including the same | Electricity | 1 | Active |
| US10923680B2 | Multifunctional composite panels and methods for the same | Emerging Cross-Sectional Technologies | 1 | Active |
| US11211510B2 | Multijunction solar cell with bonded transparent conductive interlayer | Emerging Cross-Sectional Technologies | 0 | Active |
| US12354675B2 | Nonvolatile memory device including power gating circuit and input/output circuit of a nonvolatile memory device | Physics | 0 | Active |
| US12151153B2 | Golf alignment sticks with built-in coupling mechanism | Human Necessities | 0 | Active |
| US12293801B2 | Memory interface and semiconductor memory device and semiconductor device including the same | Electricity | 0 | Active |
| US7687386B2 | Method of forming a semiconductor structure having metal migration semiconductor barrier layers | Emerging Cross-Sectional Technologies | 0 | Active |
| US12009057B2 | Semiconductor memory device and memory system including the same | Physics | 0 | Active |
| US12089435B2 | Multifunctional composite panels and methods for the same | Emerging Cross-Sectional Technologies | 0 | Active |
| US7202542B2 | Semiconductor structure with metal migration semiconductor barrier layers and method of forming the same | Emerging Cross-Sectional Technologies | 0 | Expired |
| US12387798B2 | Nonvolatile memory device providing input/output compatibility and method for setting compatibility thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.