James S. Buff
16Patents
3h-index
25Co-inventors
56Inventor score
Filing activity: Nov 10, 2005 → Mar 22, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8604443B2 | System and method for manipulating an ion beam | Electricity | 7 | Active |
| US7675047B2 | Technique for shaping a ribbon-shaped ion beam | Electricity | 6 | Active |
| US7807983B2 | Technique for reducing magnetic fields at an implant location | Electricity | 4 | Active |
| US8466431B2 | Techniques for improving extracted ion beam quality using high-transparency electrodes | Electricity | 3 | Active |
| US7402816B2 | Electron injection in ion implanter magnets | Electricity | 3 | Active |
| US7579605B2 | Multi-purpose electrostatic lens for an ion implanter system | Electricity | 2 | Active |
| US9177708B2 | Annular cooling fluid passage for magnets | Electricity | 2 | Active |
| US7339179B2 | Technique for providing a segmented electrostatic lens in an ion implanter | Electricity | 2 | Active |
| US9928988B2 | Ion source | Electricity | 1 | Active |
| US7459692B2 | Electron confinement inside magnet of ion implanter | Electricity | 1 | Active |
| US8263941B2 | Mass analysis magnet for a ribbon beam | Electricity | 1 | Active |
| US9852882B2 | Annular cooling fluid passage for magnets | Electricity | 0 | Active |
| US9793087B2 | Techniques and apparatus for manipulating an ion beam | Electricity | 0 | Active |
| US9057146B2 | Eddy current thickness measurement apparatus | Emerging Cross-Sectional Technologies | 0 | Active |
| US10217601B2 | Ion source | Electricity | 0 | Active |
| US9972475B2 | Apparatus and method to control an ion beam | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.