Joel Estrella
7Patents
1h-index
13Co-inventors
40Inventor score
Filing activity: Aug 3, 2018 → Jul 12, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10622233B2 | Amelioration of global wafer distortion based on determination of localized distortions of a semiconductor wafer | Physics | 8 | Active |
| US11346882B2 | Enhancement of yield of functional microelectronic devices | Emerging Cross-Sectional Technologies | 1 | Active |
| US11637031B2 | Systems and methods for spin process video analysis during substrate processing | Physics | 0 | Active |
| US12226796B2 | Bath systems and methods thereof | Performing Operations; Transporting | 0 | Active |
| US11738363B2 | Bath systems and methods thereof | Performing Operations; Transporting | 0 | Active |
| US11435393B2 | Enhancement of yield of functional microelectronic devices | Emerging Cross-Sectional Technologies | 0 | Active |
| US11276157B2 | Systems and methods for automated video analysis detection techniques for substrate process | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.