John A. Notte, IV
58Patents
16h-index
45Co-inventors
84Inventor score
Filing activity: Jun 15, 2001 → May 2, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7554096B2 | Ion sources, systems and methods | Electricity | 91 | Active |
| US7554097B2 | Ion sources, systems and methods | Electricity | 67 | Active |
| US7557359B2 | Ion sources, systems and methods | Electricity | 65 | Active |
| US7557358B2 | Ion sources, systems and methods | Electricity | 64 | Active |
| US7557360B2 | Ion sources, systems and methods | Electricity | 63 | Active |
| US7557361B2 | Ion sources, systems and methods | Electricity | 63 | Active |
| US7786452B2 | Ion sources, systems and methods | Electricity | 58 | Active |
| US7786451B2 | Ion sources, systems and methods | Electricity | 55 | Active |
| US7348556B2 | Method of measuring three-dimensional surface roughness of a structure | Physics | 35 | Active |
| US6515287B2 | Sectored magnetic lens and method of use | Electricity | 22 | Expired |
| US7485873B2 | Ion sources, systems and methods | Electricity | 22 | Active |
| US8110814B2 | Ion sources, systems and methods | Electricity | 20 | Active |
| US7511279B2 | Ion sources, systems and methods | Electricity | 19 | Active |
| US7511280B2 | Ion sources, systems and methods | Electricity | 18 | Active |
| US6812462B1 | Dual electron beam instrument for multi-perspective | Electricity | 17 | Expired |
| US7521693B2 | Ion sources, systems and methods | Electricity | 17 | Active |
| US7488952B2 | Ion sources, systems and methods | Electricity | 15 | Active |
| US7504639B2 | Ion sources, systems and methods | Electricity | 14 | Active |
| US7518122B2 | Ion sources, systems and methods | Electricity | 14 | Active |
| US7495232B2 | Ion sources, systems and methods | Electricity | 14 | Active |
| US6926935B2 | Proximity deposition | Electricity | 12 | Expired |
| US7804068B2 | Determining dopant information | Electricity | 9 | Active |
| US7601953B2 | Systems and methods for a gas field ion microscope | Electricity | 8 | Expired |
| US6891167B2 | Apparatus and method for applying feedback control to a magnetic lens | Electricity | 6 | Expired |
| US9218935B2 | Charged particle beam system and method of operating a charged particle beam system | Electricity | 5 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.