Jonathan Huynh
30Patents
10h-index
23Co-inventors
67Inventor score
Filing activity: Dec 12, 2007 → Jul 26, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8514630B2 | Detection of word-line leakage in memory arrays: current based approach | Physics | 44 | Active |
| US8432732B2 | Detection of word-line leakage in memory arrays | Physics | 39 | Active |
| US7683700B2 | Techniques of ripple reduction for charge pumps | Electricity | 34 | Active |
| US8699247B2 | Charge pump system dynamically reconfigurable for read and program | Electricity | 18 | Active |
| US9318209B1 | Digitally controlled source side select gate offset in 3D NAND memory erase | Physics | 18 | Active |
| US10008276B2 | High accuracy leakage detection through low voltage biasing | Physics | 18 | Active |
| US9154027B2 | Dynamic load matching charge pump for reduced current consumption | Electricity | 17 | Active |
| US8710914B1 | Voltage regulators with improved wake-up response | Physics | 17 | Active |
| US9698676B1 | Charge pump based over-sampling with uniform step size for current detection | Physics | 13 | Active |
| US8294509B2 | Charge pump systems with reduction in inefficiencies due to charge sharing between capacitances | Electricity | 11 | Active |
| US8004917B2 | Bandgap voltage and temperature coefficient trimming algorithm | Physics | 9 | Active |
| US8106701B1 | Level shifter with shoot-through current isolation | Electricity | 9 | Active |
| US9553506B1 | Charge pump strength calibration and screening in circuit design | Electricity | 9 | Active |
| US8228739B2 | Bandgap voltage and temperature coefficient trimming algorithm | Physics | 7 | Active |
| US7586362B2 | Low voltage charge pump with regulation | Electricity | 7 | Active |
| US8421524B2 | Charge pump systems with reduction in inefficiencies due to charge sharing between capacitances | Electricity | 5 | Active |
| US9208895B1 | Cell current control through power supply | Physics | 5 | Active |
| US9368224B2 | Self-adjusting regulation current for memory array source line | Physics | 4 | Active |
| US8710907B2 | Clock generator circuit for a charge pump | Electricity | 3 | Active |
| US8514628B2 | Dynamic switching approach to reduce area and power consumption of high voltage charge pumps | Electricity | 3 | Active |
| US9325276B2 | Methods and apparatus for clock oscillator temperature coefficient trimming | Physics | 3 | Active |
| US9418750B2 | Single ended word line and bit line time constant measurement | Physics | 3 | Active |
| US8537593B2 | Variable resistance switch suitable for supplying high voltage to drive load | Physics | 3 | Active |
| US9892791B2 | Fast scan to detect bit line discharge time | Physics | 2 | Active |
| US9177663B2 | Dynamic regulation of memory array source line | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.