Keith Wells
16Patents
8h-index
31Co-inventors
72Inventor score
Filing activity: Jul 19, 1993 → Nov 23, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5864394A | Surface inspection system | Electricity | 187 | Expired |
| US6081325A | Optical scanning system for surface inspection | Physics | 166 | Expired |
| US5355212A | Process for inspecting patterned wafers | Physics | 114 | Expired |
| US5604585A | Particle detection system employing a subsystem for collecting scattered light from the particles | Physics | 62 | Expired |
| US5530550A | Optical wafer positioning system | Physics | 42 | Expired |
| US9915625B2 | Optical die to database inspection | Physics | 19 | Active |
| US6888627B2 | Optical scanning system for surface inspection | Physics | 18 | Expired |
| US6922236B2 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Physics | 15 | Expired |
| US7477372B2 | Optical scanning system for surface inspection | Physics | 5 | Active |
| US11263737B2 | Defect classification and source analysis for semiconductor equipment | Electricity | 4 | Active |
| US10648924B2 | Generating high resolution images from low resolution images for semiconductor applications | Physics | 3 | Active |
| US7075637B2 | Optical scanning system for surface inspection | Physics | 3 | Expired |
| US9816940B2 | Wafer inspection with focus volumetric method | Physics | 1 | Active |
| US10012599B2 | Optical die to database inspection | Physics | 1 | Active |
| US11984330B2 | Atomic layer etch and deposition processing systems including a lens circuit with a tele-centric lens, an optical beam folding assembly, or a polygon scanner | Electricity | 0 | Active |
| US12394655B2 | Subsurface alignment metrology system for packaging applications | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.