Lorenz Lechner
12Patents
2h-index
23Co-inventors
50Inventor score
Filing activity: Apr 28, 2009 → Sep 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9905394B1 | Method for analyzing an object and a charged particle beam device for carrying out this method | Electricity | 10 | Active |
| US9140656B2 | Method of operating a particle beam microscope and a particle beam microscope | Electricity | 2 | Active |
| US8865268B2 | Method and apparatus | Emerging Cross-Sectional Technologies | 1 | Active |
| US9312093B1 | Particle beam device comprising an electrode unit | Electricity | 1 | Active |
| US9570269B2 | Method for manufacturing a TEM-lamella and assembly having a TEM-lamella protective structure | Emerging Cross-Sectional Technologies | 1 | Active |
| US9558911B2 | Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method | Electricity | 1 | Active |
| US10838191B2 | Method of operating a microscope | Physics | 0 | Active |
| US12056894B2 | Method for imaging a region of interest of a sample using a tomographic X-ray microscope, microscope, system and computer program | Physics | 0 | Active |
| US9103753B2 | TEM-lamella, process for its manufacture, and apparatus for executing the process | Emerging Cross-Sectional Technologies | 0 | Active |
| US9947507B2 | Method for preparing cross-sections by ion beam milling | Electricity | 0 | Active |
| US8835843B2 | Particle beam system and method of processing a TEM-sample | Electricity | 0 | Active |
| US10782516B2 | Method of operating a microscope | General | 0 | Revoked |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.