Inventor · Erlangen, DE

Lothar Pfitzner

10Patents
5h-index
24Co-inventors
66Inventor score

Filing activity: Oct 23, 1997 → Feb 2, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7133140B2 Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces Physics 87 Expired
US6928892B2 Configuration for determining a concentration of contaminating particles in a loading and unloading chamber of an appliance for processing at least one disk-like object Physics 18 Expired
US6622101B1 Quality surveillance of a production process Emerging Cross-Sectional Technologies 13 Expired
US7003149B2 Method and device for optically monitoring fabrication processes of finely structured surfaces in a semiconductor production Electricity 7 Expired
US6724475B2 Apparatus for rapidly measuring angle-dependent diffraction effects on finely patterned surfaces Physics 5 Expired
US7000454B2 Particle measurement configuration and semiconductor wafer processing device with such a configuration Physics 4 Expired
US6089548A Process and device for converting a liquid stream flow into a gas stream flow Emerging Cross-Sectional Technologies 3 Expired
US6784445B2 Apparatus for monitoring intentional or unavoidable layer depositions and method Electricity 1 Expired
US11988352B2 Light module, motor vehicle light assembly, and production method Mechanical Engineering; Lighting; Heating 0 Active
US12000554B2 Lighting apparatus for a motor vehicle and assembly of the components of the lighting apparatus Mechanical Engineering; Lighting; Heating 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.