Maolin Long
63Patents
8h-index
32Co-inventors
78Inventor score
Filing activity: May 4, 2001 → Jun 17, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9583357B1 | Systems and methods for reverse pulsing | Electricity | 90 | Active |
| US9761459B2 | Systems and methods for reverse pulsing | Electricity | 85 | Active |
| US9515633B1 | Transformer coupled capacitive tuning circuit with fast impedance switching for plasma etch chambers | Electricity | 38 | Active |
| US6811651B2 | Gas temperature control for a plasma process | Chemistry; Metallurgy | 34 | Expired |
| US9059678B2 | TCCT match circuit for plasma etch chambers | Electricity | 24 | Active |
| US6916401B2 | Adjustable segmented electrode apparatus and method | Electricity | 21 | Expired |
| US10264663B1 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 13 | Active |
| US7776156B2 | Side RF coil and side heater for plasma processing apparatus | Electricity | 9 | Active |
| US10638593B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 6 | Active |
| US10515781B1 | Direct drive RF circuit for substrate processing systems | Electricity | 6 | Active |
| US9966236B2 | Powered grid for plasma chamber | Electricity | 6 | Active |
| US7531061B2 | Gas temperature control for a plasma process | Chemistry; Metallurgy | 5 | Expired |
| US10121641B2 | Large dynamic range RF voltage sensor and method for voltage mode RF bias application of plasma processing systems | Electricity | 5 | Active |
| US7782979B2 | Base-band digital pre-distortion-based method for improving efficiency of RF power amplifier | Electricity | 5 | Expired |
| US10784083B2 | RF voltage sensor incorporating multiple voltage dividers for detecting RF voltages at a pickup device of a substrate support | Electricity | 5 | Active |
| US10847345B2 | Direct drive RF circuit for substrate processing systems | Electricity | 4 | Active |
| US9293353B2 | Faraday shield having plasma density decoupling structure between TCP coil zones | Electricity | 4 | Active |
| US9490106B2 | Internal Faraday shield having distributed chevron patterns and correlated positioning relative to external inner and outer TCP coil | Electricity | 3 | Active |
| US7091503B2 | Measuring plasma uniformity in-situ at wafer level | Electricity | 3 | Expired |
| US9384948B2 | Hammerhead TCP coil support for high RF power conductor etch systems | Electricity | 2 | Active |
| US10672590B2 | Frequency tuning for a matchless plasma source | Electricity | 2 | Active |
| US11716805B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 2 | Active |
| US10332725B2 | Systems and methods for reversing RF current polarity at one output of a multiple output RF matching network | Electricity | 2 | Active |
| US9305750B2 | Adjusting current ratios in inductively coupled plasma processing systems | Electricity | 2 | Active |
| US8736175B2 | Current control in plasma processing systems | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.