Marek Uncovsky
8Patents
3h-index
16Co-inventors
50Inventor score
Filing activity: Jun 26, 2003 → Jan 31, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7009187B2 | Particle detector suitable for detecting ions and electrons | Electricity | 17 | Expired |
| US10978272B2 | Measurement and endpointing of sample thickness | Electricity | 4 | Active |
| US7791020B2 | Multistage gas cascade amplifier | Electricity | 3 | Active |
| US8735849B2 | Detector for use in charged-particle microscopy | Electricity | 3 | Active |
| US9679741B2 | Environmental cell for charged particle beam system | Electricity | 2 | Active |
| US9153416B2 | Detection method for use in charged-particle microscopy | Electricity | 1 | Active |
| US11335536B2 | Light guide assembly for an electron microscope | Electricity | 0 | Active |
| US12183539B2 | Inert gas sample transfer for beam systems | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.