Inventor · Fussa, JP

Naoki Kitai

19Patents

6h-index

14Co-inventors

59Inventor score

Filing activity: Jun 3, 2002 → Aug 14, 2015

Most-cited inventions

Patent	Title	Area	Cited by	Status
US6998674B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	21	Expired
US7964484B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	14	Active
US6977858B2	Semiconductor device	Physics	9	Expired
US6885057B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	8	Expired
US7569881B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	7	Active
US7087942B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	6	Expired
US7907435B2	Semiconductor device	Physics	5	Expired
US8797791B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	4	Active
US7388238B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	4	Active
US7907442B2	Semiconductor integrated circuit	Physics	4	Active
US7692943B2	Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells	Physics	4	Active
US8031511B2	Semiconductor device	Physics	4	Active
US8437179B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	3	Active
US9111636B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	2	Active
US8847431B2	Semiconductor device including a pair of shield lines	Electricity	2	Active
US9530485B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	1	Active
US7319603B2	Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells	Physics	1	Expired
US8125017B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	1	Active
US8232589B2	Semiconductor integrated circuit device with reduced leakage current	Electricity	1	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.