Inventor · Sunnyvale, CA, US

Nety M. Krishna

17Patents
5h-index
28Co-inventors
62Inventor score

Filing activity: Feb 19, 1999 → Sep 16, 2016

Most-cited inventions

PatentTitleAreaCited byStatus
US6190037A Non-intrusive, on-the-fly (OTF) temperature measurement and monitoring system Physics 416 Expired
US7710671B1 Laminated electrically tintable windows Emerging Cross-Sectional Technologies 115 Active
US8218224B2 Laminated electrically tintable windows Emerging Cross-Sectional Technologies 49 Active
US8168265B2 Method for manufacturing electrochromic devices Physics 47 Active
US8168318B2 Method for high volume manufacturing of thin film batteries Emerging Cross-Sectional Technologies 5 Active
US8535766B2 Patterning of magnetic thin film using energized ions Electricity 4 Active
US8551578B2 Patterning of magnetic thin film using energized ions and thermal excitation Electricity 4 Active
US8580332B2 Thin-film battery methods for complexity reduction Emerging Cross-Sectional Technologies 3 Active
US8057649B2 Microwave rotatable sputtering deposition Electricity 3 Active
US8415556B2 Copper delafossite transparent P-type semiconductor thin film devices Emerging Cross-Sectional Technologies 3 Active
US8568571B2 Thin film batteries and methods for manufacturing same Emerging Cross-Sectional Technologies 3 Active
US9905723B2 Methods for plasma activation of evaporated precursors in a process chamber Emerging Cross-Sectional Technologies 1 Active
US9450135B2 Plasma enhanced thermal evaporator Emerging Cross-Sectional Technologies 1 Active
US8693078B2 Electrochromic devices Physics 1 Active
US8083859B2 Arrangement and method for removing alkali- or alkaline earth-metals from a vacuum coating chamber Chemistry; Metallurgy 0 Active
US8283199B2 Solar cell patterning and metallization Emerging Cross-Sectional Technologies 0 Active
US9263078B2 Patterning of magnetic thin film using energized ions Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.