Ofer Adan
10Patents
2h-index
24Co-inventors
50Inventor score
Filing activity: May 19, 2011 → Dec 24, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9046475B2 | High electron energy based overlay error measurement methods and systems | Physics | 15 | Active |
| US9530199B1 | Technique for measuring overlay between layers of a multilayer structure | Physics | 8 | Active |
| US10049904B1 | Method and system for moving a substrate | Electricity | 2 | Active |
| US9916652B2 | Technique for measuring overlay between layers of a multilayer structure | Physics | 2 | Active |
| US12250503B2 | Prediction of electrical properties of a semiconductor specimen | Electricity | 0 | Active |
| US9383196B2 | System, method and computed readable medium for evaluating a parameter of a feature having nano-metric dimensions | Electricity | 0 | Active |
| US9835563B2 | Evaluation system and a method for evaluating a substrate | Physics | 0 | Active |
| US10354376B2 | Technique for measuring overlay between layers of a multilayer structure | Physics | 0 | Active |
| US9297692B2 | System and method for inspecting a sample using landing lens | Physics | 0 | Active |
| US10957567B2 | Method, computer program product and system for detecting manufacturing process defects | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.