Peter Robertson
15Patents
7h-index
14Co-inventors
63Inventor score
Filing activity: Mar 18, 1975 → Aug 11, 2010
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6280602A | Method and apparatus for determination of additives in metal plating baths | Physics | 28 | Expired |
| US4040938A | Electrode arrangement for electrochemical cells | Chemistry; Metallurgy | 20 | Expired |
| US4873057A | Apparatus for carrying out a titration procedure for the chemical analysis of a sample | Emerging Cross-Sectional Technologies | 17 | Expired |
| US6592737B1 | Method and apparatus for determination of additives in metal plating baths | Physics | 16 | Expired |
| US8480739B2 | C1-C2 implant and methods of use | Human Necessities | 15 | Active |
| US4097346A | Electrochemical oxidation of diacetone-L-sorbose to diacetone-L-ketogulonic acid | Chemistry; Metallurgy | 13 | Expired |
| US5571978A | Apparatus for testing bottles for the presence of contamination | Physics | 11 | Expired |
| US6709568B2 | Method for determining concentrations of additives in acid copper electrochemical deposition baths | Physics | 7 | Expired |
| US5520060A | Process and apparatus for testing bottles for the presence of contamination | Physics | 7 | Expired |
| US6758960B1 | Electrode assembly and method of using the same | Physics | 6 | Expired |
| US5753508A | Method of testing a function of a detector at an inspection station and apparatus therefor | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6495011B2 | Apparatus for determination of additives in metal plating baths | Physics | 5 | Expired |
| US5523565A | Use of a mass spectrometer with secondary ionization for the inspection of containers | Physics | 3 | Expired |
| US6758955B2 | Methods for determination of additive concentration in metal plating baths | Physics | 3 | Expired |
| US6936157B2 | Interference correction of additives concentration measurements in metal electroplating solutions | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.