Ralph G. Whitten
34Patents
18h-index
27Co-inventors
81Inventor score
Filing activity: Apr 15, 1986 → Jun 1, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5661592A | Method of making and an apparatus for a flat diffraction grating light valve | Emerging Cross-Sectional Technologies | 254 | Expired |
| US6429029B1 | Concurrent design and subsequent partitioning of product and test die | Electricity | 173 | Expired |
| US6690185B1 | Large contactor with multiple, aligned contactor units | Physics | 173 | Expired |
| US6456099B1 | Special contact points for accessing internal circuitry of an integrated circuit | Electricity | 134 | Expired |
| US5341267A | Structures for electrostatic discharge protection of electrical and other components | Electricity | 95 | Expired |
| US4796075A | Fusible link structure for integrated circuits | Electricity | 93 | Expired |
| US6825052B2 | Test assembly including a test die for testing a semiconductor product die | Electricity | 92 | Expired |
| US6621260B2 | Special contact points for accessing internal circuitry of an integrated circuit | Electricity | 81 | Expired |
| US6476630B1 | Method for testing signal paths between an integrated circuit wafer and a wafer tester | Physics | 79 | Expired |
| US6597187B2 | Special contact points for accessing internal circuitry of an integrated circuit | Electricity | 79 | Expired |
| US5903041A | Integrated two-terminal fuse-antifuse and fuse and integrated two-terminal fuse-antifuse structures incorporating an air gap | Electricity | 78 | Expired |
| US6603324B2 | Special contact points for accessing internal circuitry of an integrated circuit | Electricity | 73 | Expired |
| US6551844B1 | Test assembly including a test die for testing a semiconductor product die | Electricity | 59 | Expired |
| US5502315A | Electrically programmable interconnect structure having a PECVD amorphous silicon element | Electricity | 50 | Expired |
| US5780919A | Electrically programmable interconnect structure having a PECVD amorphous silicon element | Electricity | 29 | Expired |
| US5451811A | Electrically programmable interconnect element for integrated circuits | Electricity | 27 | Expired |
| US5412261A | Two-stage programmable interconnect architecture | Electricity | 25 | Expired |
| US9547968B2 | Pre-smoke detector and system for use in early detection of developing fires | Physics | 23 | Active |
| US6940093B2 | Special contact points for accessing internal circuitry of an integrated circuit | Electricity | 17 | Expired |
| US10453321B2 | Pre-smoke detector and system for use in early detection of developing fires | Physics | 17 | Active |
| US9922517B2 | Pre-smoke detector and system for use in early detection of developing fires | Physics | 15 | Active |
| US7557596B2 | Test assembly including a test die for testing a semiconductor product die | Electricity | 12 | Expired |
| US5717230A | Field programmable gate array having reproducible metal-to-metal amorphous silicon antifuses | Electricity | 10 | Expired |
| US6150199A | Method for fabrication of programmable interconnect structure | Electricity | 9 | Expired |
| US10724976B2 | Systems and methods for determining at least one property of a material | Physics | 9 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.