Raman Viswanathan
17Patents
8h-index
33Co-inventors
72Inventor score
Filing activity: Oct 9, 1980 → May 26, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5051598A | Method for correcting proximity effects in electron beam lithography | Electricity | 71 | Expired |
| US4556884A | Depth dependent multiple logging system | Physics | 27 | Expired |
| US6051483A | Formation of ultra-shallow semiconductor junction using microwave annealing | Electricity | 27 | Expired |
| US5781607A | Membrane mask structure, fabrication and use | Physics | 17 | Expired |
| US4346593A | Well logging correction method and apparatus | Physics | 12 | Expired |
| US6051283A | Microwave annealing | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6172399A | Formation of ultra-shallow semiconductor junction using microwave annealing | Electricity | 9 | Expired |
| US8581742B2 | Bandwidth wireline data transmission system and method | Physics | 8 | Active |
| US8023690B2 | Apparatus and method for imaging fluids downhole | Physics | 8 | Active |
| US6316123A | Microwave annealing | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7767385B2 | Method for lithography for optimizing process conditions | Physics | 3 | Active |
| US6009143A | Mirror for providing selective exposure in X-ray lithography | Physics | 1 | Expired |
| US7659050B2 | High resolution silicon-containing resist | Physics | 1 | Expired |
| US9664815B2 | Telemetry method and system for subsurface well and reservoir and logging data | Fixed Constructions | 1 | Active |
| US7399573B2 | Method for using negative tone silicon-containing resist for e-beam lithography | Emerging Cross-Sectional Technologies | 1 | Active |
| US6440639B1 | High-aspect ratio resist development using safe-solvent mixtures of alcohol and water | Physics | 0 | Expired |
| US10365402B2 | Telemetry method and system for subsurface well and reservoir logging data | Fixed Constructions | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.