Raphael P. Robertazzi
16Patents
4h-index
15Co-inventors
53Inventor score
Filing activity: Mar 1, 2005 → Mar 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7005879B1 | Device for probe card power bus noise reduction | Physics | 96 | Expired |
| US9588174B1 | Method for testing through silicon vias in 3D integrated circuits | Physics | 6 | Active |
| US8542030B2 | Three-dimensional (3D) stacked integrated circuit testing | Physics | 5 | Active |
| US9568540B2 | Method for the characterization and monitoring of integrated circuits | Physics | 4 | Active |
| US7187194B2 | Device for probe card power bus voltage drop reduction | Physics | 2 | Expired |
| US10102090B2 | Non-destructive analysis to determine use history of processor | Physics | 1 | Active |
| US10429433B2 | Method for the characterization and monitoring of integrated circuits | Physics | 1 | Active |
| US10491610B2 | Remote monitoring of software | Electricity | 1 | Active |
| US9784790B2 | Method for testing through silicon vias in 3D integrated circuits | Physics | 1 | Active |
| US10379152B2 | Method for the characterization and monitoring of integrated circuits | Physics | 1 | Active |
| US11061063B2 | Method for the characterization and monitoring of integrated circuits | Physics | 0 | Active |
| US12150389B2 | Single flux quantum circuitry for quantized flux bias control | Electricity | 0 | Active |
| US11169200B2 | Method for the characterization and monitoring of integrated circuits | Physics | 0 | Active |
| US7408373B2 | Device for probe card power bus voltage drop reduction | Physics | 0 | Active |
| US10552278B2 | Non-destructive analysis to determine use history of processor | Physics | 0 | Active |
| US11105856B2 | Detection of performance degradation in integrated circuits | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.