Inventor · Old Bridge, NJ, US

Richard E. Thomas

19Patents
9h-index
19Co-inventors
69Inventor score

Filing activity: Jun 28, 1971 → Aug 28, 1995

Most-cited inventions

PatentTitleAreaCited byStatus
US5336993A Assembly for testing rectifiers and regulators of automotive alternators Physics 185 Expired
US5594136A Texaphyrin solid supports and devices Performing Operations; Transporting 46 Expired
US4101800A Controlled-porosity dispenser cathode Electricity 20 Expired
US4051283A Printed sheets containing concealed images and method and materials for preparation and visual development of same Emerging Cross-Sectional Technologies 18 Expired
US4379979A Controlled porosity sheet for thermionic dispenser cathode and method of manufacture Emerging Cross-Sectional Technologies 18 Expired
US5744302A Method for separating molecules Chemistry; Metallurgy 12 Expired
US4254357A Multi-arrayed micro-patch emitter with integral control grid Electricity 11 Expired
US5672490A Method of cleaving DNA Chemistry; Metallurgy 10 Expired
USD295780S Trap for plumbing installations General 10 Expired
US4097637A Latent imaging master Emerging Cross-Sectional Technologies 9 Expired
US5808059A Matrix-supported sapphyrins Chemistry; Metallurgy 6 Expired
US4745326A Method of manufacturing integral shadow gridded controlled porosity, dispenser cathodes Electricity 6 Expired
US4242462A Electrically powered self-heating inoculating loop Chemistry; Metallurgy 4 Expired
US3971110A Method for fabricating an electron-emission cathode Electricity 4 Expired
US4371809A Integral-shadow-grid controlled-porosity dispenser cathode Electricity 4 Expired
US4675091A Co-sputtered thermionic cathodes and fabrication thereof Electricity 3 Expired
US4038761A Element and method for teaching with liquid crystals Human Necessities 3 Expired
US4144488A Investigation of near-surface electronic properties in semiconductors by electron beam scanning Physics 2 Expired
US4142145A Method for determining conduction-band edge and electron affinity in semiconductors Physics 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.