Romain Sappey
7Patents
3h-index
6Co-inventors
46Inventor score
Filing activity: May 17, 2005 → May 27, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7847954B2 | Measuring the shape and thickness variation of a wafer with high slopes | Physics | 11 | Active |
| US7554654B2 | Surface characteristic analysis | Physics | 10 | Active |
| US9772289B2 | System and method for defect detection and photoluminescence measurement of a sample | Physics | 3 | Active |
| US9410890B2 | Methods and apparatus for spectral luminescence measurement | Physics | 3 | Active |
| US8736831B2 | Substrate inspection | Physics | 3 | Active |
| US9354177B2 | System and method for defect detection and photoluminescence measurement of a sample | Physics | 2 | Active |
| US7505143B2 | Dynamic reference plane compensation | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.