Stewart Bean
9Patents
3h-index
8Co-inventors
46Inventor score
Filing activity: Oct 14, 2011 → Oct 23, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9741528B2 | Charged particle optical apparatus having a selectively positionable differential pressure module | Electricity | 5 | Active |
| US10068744B2 | Charged particle optical apparatus for through-the lens detection of particles | Electricity | 4 | Active |
| US8426812B2 | Microscope system, method for operating a charged-particle microscope | Electricity | 3 | Active |
| US8648301B2 | Particle beam system having a hollow light guide | Electricity | 2 | Active |
| US10522321B2 | Charged particle optical apparatus for through-the-lens detection of particles | Electricity | 2 | Active |
| US9159532B2 | Method of analyzing a sample and charged particle beam device for analyzing a sample | Electricity | 1 | Active |
| US8859992B2 | Charged particle beam devices | Electricity | 1 | Active |
| US11276547B2 | Charged particle optical apparatus for through-the-lens detection of particles | Electricity | 0 | Active |
| US10861670B2 | Charged particle optical apparatus for through-the-lens detection of particles | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.