Stuart Rapoport
5Patents
5h-index
9Co-inventors
42Inventor score
Filing activity: Apr 4, 1994 → Mar 3, 1995
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5535164A | BIST tester for multiple memories | Physics | 98 | Expired |
| US5557619A | Integrated circuits with a processor-based array built-in self test circuit | Physics | 45 | Expired |
| US5442641A | Fast data compression circuit for semiconductor memory chips including an array built-in self-test structure | Physics | 37 | Expired |
| US5386392A | Programmable high speed array clock generator circuit for array built-in self test memory chips | Electricity | 26 | Expired |
| US6081910A | Circuit for allowing a two-pass fuse blow to memory chips combining an array built-in self-test with redundancy capabilities | Physics | 20 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.