Terry Sinclair Connacher
10Patents
3h-index
14Co-inventors
57Inventor score
Filing activity: Nov 10, 2003 → Apr 22, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11828796B1 | Integrated heater and temperature measurement | Physics | 6 | Active |
| US6958617B1 | Electromechanical module, for holding IC-chips in a chip testing system, that synchronizes and translates test signals to the IC-chips | Physics | 6 | Expired |
| US6924636B2 | System for testing one or more groups of IC-chips while concurrently loading/unloading another group | Physics | 5 | Expired |
| US6919718B2 | System for testing a group of IC-chips having a chip holding subassembly that is built-in and loaded/unloaded automatically | Physics | 3 | Expired |
| US6909299B1 | System for testing multiple groups of IC-chips which concurrently sends time-shifted test signals to the groups | Physics | 2 | Expired |
| US12013432B1 | Thermal control wafer with integrated heating-sensing elements | Physics | 1 | Active |
| US12000885B1 | Multiplexed thermal control wafer and coldplate | Physics | 1 | Active |
| US12061227B1 | Integrated heater and temperature measurement | Physics | 1 | Active |
| US12085609B1 | Thermal control wafer with integrated heating-sensing elements | Physics | 0 | Active |
| US12259428B1 | Multiplexed thermal control wafer and coldplate | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.