Thomas Wolf
17Patents
4h-index
42Co-inventors
60Inventor score
Filing activity: Apr 26, 1985 → Mar 28, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6985229B2 | Overlay metrology using scatterometry profiling | Physics | 32 | Expired |
| US5057462A | Compensation of lithographic and etch proximity effects | Emerging Cross-Sectional Technologies | 31 | Expired |
| US4757056A | Method for tumor regression in rats, mice and hamsters using hexuronyl hexosaminoglycan-containing compositions | Human Necessities | 25 | Expired |
| US5215867A | Method with gas functionalized plasma developed layer | Physics | 15 | Expired |
| US9229444B2 | Numerical control (NC) program and process for simplified reproduction on a machine tool | Emerging Cross-Sectional Technologies | 3 | Active |
| US6559062B1 | Method for avoiding notching in a semiconductor interconnect during a metal etching step | Electricity | 2 | Expired |
| US11454304B2 | Actuator comprising anti-backbend chain | Mechanical Engineering; Lighting; Heating | 2 | Active |
| US7160799B2 | Define via in dual damascene process | Electricity | 2 | Expired |
| US5780316A | Linewidth control apparatus and method | Electricity | 2 | Expired |
| US8393200B2 | Device and method for measuring mechanical properties of materials | Physics | 2 | Active |
| US11248684B2 | Actuator with an anti-backbend chain | Fixed Constructions | 1 | Active |
| US12203749B2 | Chain elongation monitoring device and method for determining wear | Physics | 0 | Active |
| US10801862B2 | Device and method for determining the wear state of a chain | Physics | 0 | Active |
| US11518622B2 | Apparatus and method for determining the wear condition of a chain | Physics | 0 | Active |
| US11524848B2 | Apparatus and method for determining the wear condition of a chain | Physics | 0 | Active |
| US7262129B2 | Minimizing resist poisoning in the manufacture of semiconductor devices | Electricity | 0 | Expired |
| US7425502B2 | Minimizing resist poisoning in the manufacture of semiconductor devices | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.