Tsutomu Negishi
18Patents
10h-index
35Co-inventors
72Inventor score
Filing activity: Jul 16, 1987 → Jun 3, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6321266A | Input/output apparatus connected to a plurality of host computers via a network | Electricity | 99 | Expired |
| US5996029A | Information input/output control apparatus and method for indicating which of at least one information terminal device is able to execute a functional operation based on environmental information | Electricity | 75 | Expired |
| US5859956A | Information processing device and information processing method | Electricity | 63 | Expired |
| US5740028A | Information input/output control device and method therefor | Electricity | 60 | Expired |
| US6177934A | Server device and image processing device | Electricity | 46 | Expired |
| US4855133A | Composition for attracting flies | Human Necessities | 24 | Expired |
| US6804016B2 | Control apparatus for a scanner/printer | Electricity | 15 | Expired |
| US5130540A | Method and apparatus for automatic focusing of scanning electron microscope | Electricity | 14 | Expired |
| US5834774A | Scanning electron microscope | Electricity | 14 | Expired |
| US6444991B1 | Scanning charged-particle beam instrument | Electricity | 10 | Expired |
| US6787770B2 | Method of inspecting holes using charged-particle beam | Physics | 7 | Expired |
| US7154616B2 | Application charging system, information processing apparatus, and control method therefor and memory medium storing program therefor | Physics | 6 | Expired |
| US9507139B2 | Specimen holder, specimen preparation device, and positioning method | Electricity | 2 | Active |
| US11837437B2 | Specimen machining device and information provision method | Electricity | 1 | Active |
| US10930467B2 | Sample holder system and sample observation apparatus | Electricity | 1 | Active |
| US11043355B2 | Vacuum cooling apparatus and ion milling apparatus | Electricity | 0 | Active |
| US8716683B2 | Ion beam processing system and sample processing method | Physics | 0 | Active |
| US6888137B1 | Instrument and method for observing selected stored images acquired from a scanning charged-particle beam | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.