Inventor · Singapore, SG

Wang Ling Goh

18Patents
8h-index
25Co-inventors
64Inventor score

Filing activity: Oct 2, 2000 → Aug 21, 2006

Most-cited inventions

PatentTitleAreaCited byStatus
US6376376B1 Method to prevent CU dishing during damascene formation Electricity 43 Expired
US6841847B2 3-D spiral stacked inductor on semiconductor material Emerging Cross-Sectional Technologies 34 Expired
US6558994B2 Dual silicon-on-insulator device wafer die Emerging Cross-Sectional Technologies 31 Expired
US6380084B1 Method to form high performance copper damascene interconnects by de-coupling via and metal line filling Electricity 27 Expired
US6613652B2 Method for fabricating SOI devices with option of incorporating air-gap feature for better insulation and performance Electricity 20 Expired
US6403484B1 Method to achieve STI planarization Electricity 11 Expired
US6613649B2 Method for buffer STI scheme with a hard mask layer as an oxidation barrier Electricity 8 Expired
US6468880B1 Method for fabricating complementary silicon on insulator devices using wafer bonding Emerging Cross-Sectional Technologies 8 Expired
US7119010B2 Integrated circuit with self-aligned line and via and manufacturing method therefor Electricity 6 Expired
US6849928B2 Dual silicon-on-insulator device wafer die Emerging Cross-Sectional Technologies 5 Expired
US6998682B2 Method of forming a partially depleted silicon on insulator (PDSOI) transistor with a pad lock body extension Electricity 5 Expired
US6905919B2 Method of forming a partially depleted silicon on insulator (PDSOI) transistor with a pad lock body extension Electricity 4 Expired
US7721414B2 Method of manufacturing 3-D spiral stacked inductor on semiconductor material Emerging Cross-Sectional Technologies 4 Active
US6613648B1 Shallow trench isolation using TEOS cap and polysilicon pullback Electricity 2 Expired
US7060573B2 Extended poly buffer STI scheme Electricity 1 Expired
US8766454B2 Integrated circuit with self-aligned line and via Electricity 1 Active
US6399471B1 Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application Electricity 1 Expired
US6472697B2 Assorted aluminum wiring design to enhance chip-level performance for deep sub-micron application Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.