Wei-Liang Chen
16Patents
4h-index
40Co-inventors
60Inventor score
Filing activity: Jul 8, 1993 → Mar 27, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5342567A | Process for producing high tenacity and high modulus polyethylene fibers | Textiles; Paper | 31 | Expired |
| US5834580A | Polyurethanes prepared from amide linkages-containing diamine chain extender | Chemistry; Metallurgy | 16 | Expired |
| US8861318B1 | Thermally assisted magnetic write head, and method of manufacturing the same | Physics | 6 | Active |
| US6115126A | Optical wavefront analyzer and method using a single wave shifter | Physics | 4 | Expired |
| US7221315B1 | GPS system for receiving and processing GPS signal and traffic information signal | Physics | 2 | Active |
| US7086458B2 | Heat sink structure with flexible heat dissipation pad | Electricity | 2 | Expired |
| US6985978B1 | Method of optimizing topology of IEEE 1394 serial bus | Physics | 1 | Expired |
| US12369336B2 | Method and system for forming metal-insulator-metal capacitors | Electricity | 0 | Active |
| US12363928B2 | Surface damage control in diodes | Electricity | 0 | Active |
| US11502160B2 | Method and system for forming metal-insulator-metal capacitors | Electricity | 0 | Active |
| US10401884B2 | Power supply array system capable of outputting multiple voltages | Physics | 0 | Active |
| US12094756B2 | Semiconductor arrangement comprising isolation structure comprising at least two electrical insulator layers | Electricity | 0 | Active |
| US11973148B2 | Surface damage control in diodes | Electricity | 0 | Active |
| US8139697B2 | Sampling method and data recovery circuit using the same | Electricity | 0 | Active |
| US10191883B2 | Inter-integrated circuit bus arbitration system capable of avoiding host conflict | Physics | 0 | Active |
| US11562923B2 | Semiconductor arrangement including a first electrical insulator layer and a second electrical insulator layer and method of making | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.