William E. Guthrie
11Patents
3h-index
8Co-inventors
53Inventor score
Filing activity: Jul 20, 1999 → Aug 3, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10748744B1 | Method and system for determining a charged particle beam exposure for a local pattern density | Electricity | 4 | Active |
| US10460071B2 | Shaped beam lithography including temperature effects | Electricity | 4 | Active |
| US6823294B1 | Method and system for measuring circuit design capability | Physics | 3 | Expired |
| US11062878B2 | Method and system for determining a charged particle beam exposure for a local pattern density | Electricity | 3 | Active |
| US10564853B2 | System and method for locality detection to identify read or write streams in a memory device | Physics | 2 | Active |
| US11756765B2 | Method and system for determining a charged particle beam exposure for a local pattern density | Electricity | 1 | Active |
| US11886166B2 | Method and system of reducing charged particle beam write time | Electricity | 0 | Active |
| US12243712B2 | Method and system for determining a charged particle beam exposure for a local pattern density | Electricity | 0 | Active |
| US11592802B2 | Method and system of reducing charged particle beam write time | Electricity | 0 | Active |
| US11604451B2 | Method and system of reducing charged particle beam write time | Electricity | 0 | Active |
| US10884395B2 | Method and system of reducing charged particle beam write time | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.