Inventor · Williston, VT, US

Wing L. Lai

10Patents

4h-index

25Co-inventors

56Inventor score

Filing activity: Nov 4, 2003 → Oct 13, 2015

Most-cited inventions

Patent	Title	Area	Cited by	Status
US7067886B2	Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damage	Electricity	92	Expired
US9231072B2	Multi-composition gate dielectric field effect transistors	Electricity	10	Active
US7132318B2	Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damage	Electricity	8	Expired
US9190406B2	Fin field effect transistors having heteroepitaxial channels	Electricity	6	Active
US9224826B2	Multiple thickness gate dielectrics for replacement gate field effect transistors	Electricity	2	Active
US9099393B2	Enabling enhanced reliability and mobility for replacement gate planar and FinFET structures	Electricity	2	Active
US7477961B2	Equivalent gate count yield estimation for integrated circuit devices	Physics	0	Active
US9177868B2	Annealing oxide gate dielectric layers for replacement metal gate field effect transistors	Electricity	0	Active
US9397175B2	Multi-composition gate dielectric field effect transistors	Electricity	0	Active
US9368593B2	Multiple thickness gate dielectrics for replacement gate field effect transistors	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.