Xianjin Wan
14Patents
3h-index
19Co-inventors
49Inventor score
Filing activity: Jul 26, 2018 → Aug 8, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10553604B2 | Through array contact structure of three-dimensional memory device | Electricity | 21 | Active |
| US10910397B2 | Through array contact structure of three- dimensional memory device | Electricity | 5 | Active |
| US11785776B2 | Through array contact structure of three-dimensional memory device | Electricity | 3 | Active |
| US11177231B2 | Bonding contacts having capping layer and method for forming the same | Electricity | 2 | Active |
| US10811380B2 | Semiconductor structure and forming method thereof | Electricity | 1 | Active |
| US10886291B2 | Joint opening structures of three-dimensional memory devices and methods for forming the same | Electricity | 1 | Active |
| US10818631B2 | Semiconductor structure and method of forming the same | Electricity | 1 | Active |
| US11545505B2 | Through array contact structure of three-dimensional memory device | Electricity | 1 | Active |
| US11482532B2 | Joint opening structures of three-dimensional memory devices and methods for forming the same | Electricity | 0 | Active |
| US11956953B2 | Joint opening structures of three-dimensional memory devices and methods for forming the same | Electricity | 0 | Active |
| US10847532B2 | Joint opening structures of three-dimensional memory devices and methods for forming the same | General | 0 | Revoked |
| US11715718B2 | Bonding contacts having capping layer and method for forming the same | Electricity | 0 | Active |
| US12185550B2 | Through array contact structure of three-dimensional memory device | Electricity | 0 | Active |
| US12394751B2 | Method of forming semiconductor structure | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.