Yaowu Mo
40Patents
8h-index
34Co-inventors
71Inventor score
Filing activity: Jul 31, 2007 → Dec 28, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10397500B1 | Wide dynamic range image sensor pixel cell | Electricity | 66 | Active |
| US7746400B2 | Method, apparatus, and system providing multi-column shared readout for imagers | Electricity | 17 | Active |
| US10250832B1 | Stacked rolling shutter and global shutter image sensor with knee self point calibration | Electricity | 12 | Active |
| US8405747B2 | Analog row black level calibration for CMOS image sensor | Electricity | 12 | Active |
| US10334189B1 | HDR pixel array with double diagonal binning | Electricity | 11 | Active |
| US10670526B2 | DNA sequencing system with stacked BSI global shutter image sensor | Physics | 10 | Active |
| US8809759B2 | Multiple-row concurrent readout scheme for high-speed CMOS image sensor with backside illumination | Electricity | 10 | Active |
| US8599284B2 | High dynamic range sub-sampling architecture | Electricity | 9 | Active |
| US8730364B2 | Image sensor with pipelined column analog-to-digital converters | Electricity | 8 | Active |
| US8508629B2 | Analog row black level calibration for CMOS image sensor | Electricity | 6 | Active |
| US8576979B2 | Arithmetic counter circuit, configuration and application for high performance CMOS image sensors | Electricity | 6 | Active |
| US8368789B2 | Systems and methods to provide reference current with negative temperature coefficient | Physics | 6 | Active |
| US8643750B2 | Reducing noise in image sensors by concurrently reading reset and image signal levels from active and reference pixels | Electricity | 6 | Active |
| US10002901B1 | Stacked image sensor with embedded FPGA and pixel cell with selectable shutter modes and in-pixel CDs | Electricity | 5 | Active |
| US10070081B2 | Stacked image sensor pixel cell with dynamic range enhancement and selectable shutter modes and in-pixel CDS | Electricity | 4 | Active |
| US8102451B2 | VLN biasing scheme to achieve low vertical shading for high-speed and large-format CMOS image sensors with top/bottom readout scheme | Electricity | 4 | Active |
| US8324548B2 | Imaging devices and methods for charge transfer | Electricity | 4 | Active |
| US9991298B1 | Stacked image sensor pixel cell with a charge amplifier and selectable shutter modes and in-pixel CDS | Electricity | 4 | Active |
| US8390712B2 | Image sensing pixels with feedback loops for imaging systems | Electricity | 4 | Active |
| US10250828B1 | Global shutter image sensor with anti-blooming pixel and knee point self-calibration | Electricity | 4 | Active |
| US8089532B2 | Method and apparatus providing pixel-wise noise correction | Electricity | 3 | Active |
| US7924330B2 | Methods and apparatuses for double sided dark reference pixel row-wise dark level non-uniformity compensation in image signals | Electricity | 3 | Active |
| US8466991B2 | Optical black pixel cell readout systems and methods | Electricity | 3 | Active |
| US8077227B2 | Method and apparatus providing analog row noise correction and hot pixel filtering | Electricity | 2 | Active |
| US9571763B2 | Split pixel high dynamic range sensor | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.