Yi Wang
46Patents
10h-index
85Co-inventors
78Inventor score
Filing activity: Sep 5, 1997 → Dec 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6198959A | Coronary magnetic resonance angiography using motion matched acquisition | Physics | 95 | Expired |
| US5928148A | Method for performing magnetic resonance angiography over a large field of view using table stepping | Human Necessities | 80 | Expired |
| US7545967B1 | System and method for generating composite subtraction images for magnetic resonance imaging | Emerging Cross-Sectional Technologies | 63 | Expired |
| US7941204B1 | Magnetic resonance imaging concepts | Physics | 36 | Active |
| US6230040A | Method for performing magnetic resonance angiography with dynamic k-space sampling | Physics | 29 | Expired |
| US7999548B1 | Dual lower extremity MRI coil array with simultaneously independent MRI signal detection from both legs | Physics | 18 | Active |
| US6791323B2 | Method and apparatus for measuring and correcting motion effects using navigator echoes | Physics | 18 | Expired |
| US9991147B2 | Wafer grounding and biasing method, apparatus, and application | Electricity | 14 | Active |
| US7734078B2 | System and method for generating composite substraction images for magnetic resonance imaging | Emerging Cross-Sectional Technologies | 13 | Active |
| US7003343B2 | Method and apparatus for anatomically tailored k-space sampling and recessed elliptical view ordering for bolus-enhanced 3D MR angiography | Human Necessities | 10 | Expired |
| US8908348B2 | Wafer grounding and biasing method, apparatus, and application | Electricity | 7 | Active |
| US7919760B2 | Operation stage for wafer edge inspection and review | Electricity | 6 | Active |
| US8094924B2 | E-beam defect review system | Electricity | 5 | Active |
| US8094428B2 | Wafer grounding methodology | Electricity | 5 | Active |
| US8294094B1 | Method and apparatus for reducing substrate edge effect during inspection | Electricity | 4 | Active |
| US9536697B2 | System and method for calibrating charge-regulating module | Electricity | 4 | Active |
| US8809779B2 | Method and system for heating substrate in vacuum environment and method and system for identifying defects on substrate | Physics | 4 | Active |
| US8624186B2 | Movable detector for charged particle beam inspection or review | Electricity | 4 | Active |
| US6791095B2 | Method and system of using a scanning electron microscope in semiconductor wafer inspection with Z-stage focus | Electricity | 4 | Expired |
| US9572514B2 | Magnetic resonance imaging concepts | Physics | 4 | Active |
| US7767982B2 | Optical auto focusing system and method for electron beam inspection tool | Electricity | 3 | Active |
| USD1025930S1 | Controller | General | 3 | Active |
| US8218284B2 | Apparatus for increasing electric conductivity to a semiconductor wafer substrate when exposure to electron beam | Emerging Cross-Sectional Technologies | 3 | Active |
| USD991805S1 | Mella pet thermometer | General | 3 | Active |
| US8791414B2 | Dynamic focus adjustment with optical height detection apparatus in electron beam system | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.