Yuhou Wang
16Patents
2h-index
8Co-inventors
39Inventor score
Filing activity: Oct 18, 2017 → Jul 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10264663B1 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 13 | Active |
| US10638593B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 6 | Active |
| US11716805B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 2 | Active |
| US10672590B2 | Frequency tuning for a matchless plasma source | Electricity | 2 | Active |
| US10957521B2 | Image based plasma sheath profile detection on plasma processing tools | Electricity | 2 | Active |
| US11342159B2 | RF pulsing within pulsing for semiconductor RF plasma processing | Electricity | 1 | Active |
| US11224116B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 1 | Active |
| US11728136B2 | RF pulsing within pulsing for semiconductor RF plasma processing | Electricity | 1 | Active |
| US10879044B2 | Auxiliary circuit in RF matching network for frequency tuning assisted dual-level pulsing | Electricity | 1 | Active |
| US12397435B2 | Substrate location detection and adjustment | Electricity | 0 | Active |
| US12424410B2 | RF pulsing within pulsing for semiconductor RF plasma processing | Electricity | 0 | Active |
| US12261029B2 | Protection system for switches in direct drive circuits of substrate processing systems | Emerging Cross-Sectional Technologies | 0 | Active |
| US12165841B2 | Dual-frequency, direct-drive inductively coupled plasma source | Electricity | 0 | Active |
| US11728137B2 | Direct frequency tuning for matchless plasma source in substrate processing systems | Emerging Cross-Sectional Technologies | 0 | Active |
| US12193138B2 | Matchless plasma source for semiconductor wafer fabrication | Electricity | 0 | Active |
| US11437219B2 | Frequency tuning for a matchless plasma source | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.