Patent · US Active

Method and system for supplying a cleaning gas into a process chamber

US10094486B2 · kind B2 · utility

1Cited by
27References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 4, 2015
Grant dateOct 9, 2018
Priority date
Expiry dateApr 26, 2036

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/905
  • WIPO fieldMechanical elements
  • WIPO sectorMechanical engineering

Abstract

A method and apparatus for cleaning a process chamber are provided. In one embodiment, a process chamber is provided that includes a remote plasma source and a process chamber having at least two processing regions. Each processing region includes a substrate support assembly disposed in the processing region, a gas distribution system configured to provide gas into the processing region above the substrate support assembly, and a gas passage configured to provide gas into the processing region below the substrate support assembly. A first gas conduit is configured to flow a cleaning agent from the remote plasma source through the gas distribution assembly in each processing region while a second gas conduit is configured to divert a portion of the cleaning agent from the first gas conduit to the gas passage of each processing region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.