Patent · US Active

Creating ion energy distribution functions (IEDF)

US10312048B2 · kind B2 · utility

39Cited by
13References
19Claims
0Family size

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Key dates

Filing dateDec 7, 2017
Grant dateJun 4, 2019
Priority date
Expiry dateDec 7, 2037

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32715
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Systems and methods for creating arbitrarily-shaped ion energy distribution functions using shaped-pulse-bias. In an embodiment, a method includes applying a positive jump voltage to an electrode of a process chamber to neutralize a wafer surface, applying a negative jump voltage to the electrode to set a wafer voltage, and modulating the amplitude of the wafer voltage to produce a predetermined number of pulses to determine an ion energy distribution function. In another embodiment a method includes applying a positive jump voltage to an electrode of a process chamber to neutralize a wafer surface, applying a negative jump voltage to the electrode to set a wafer voltage, and applying a ramp voltage to the electrode that overcompensates for ion current on the wafer or applying a ramp voltage to the electrode that undercompensates for ion current on the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.