Method of manufacturing a semiconductor device including an LDMOS transistor
US10629727B2 · kind B2 · utility
1Cited by
17References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 10, 2018 |
| Grant date | Apr 21, 2020 |
| Priority date | — |
| Expiry date | Aug 10, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/112
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
In an embodiment, a semiconductor device includes a semiconductor substrate having a front surface, a LDMOS transistor in the front surface, and a metallization structure arranged on the front surface. The metallization structure includes at least one cavity arranged in at least one dielectric layer. Related methods of manufacture are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.