Patent · US Active

Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates

US10738219B2 · kind B2 · utility

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14Claims
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Key dates

Filing dateDec 16, 2015
Grant dateAug 11, 2020
Priority date
Expiry dateDec 16, 2035

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC08K5/5435
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and/or co-balt alloy comprising substrates Abstract Use of a chemical mechanical polishing (CMP) composition (Q) for chemical mechanical polishing of a substrate (S) comprising (i) cobalt and/or (ii) a cobalt alloy, wherein the CMP composition (Q) comprises (A) Inorganic particles (B) a substituted tetrazole derivative of the general formula (I), wherein R1 is H, hydroxy, alkyl, aryl, alkylaryl, amino, carboxyl, alkylcarboxyl, thio or alkylthio. (C) at least one amino acid (D) at least one oxidizer, (E) an aqueous medium and wherein the CMP composition (Q) has a pH of from 7 to 10.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.